A Homotopy Continuation Approach for Testing a Basic Analog Circuit
H. Vazquez-Leal *
Electronic Instrumentation School and Atmospheric Sciences School, Universidad Veracruzana, Gonzalo Aguirre Beltrán S/N, Xalapa, Veracruz, Mexico 91000.
A. Sarmiento-Reyes
Electronics Department, National Institute for Astrophysics, Optics and Electronics, Sta. Maria Tonantzintla, Puebla, Mexico 72000.
U. Filobello-Nino
Electronic Instrumentation School and Atmospheric Sciences School, Universidad Veracruzana, Gonzalo Aguirre Beltrán S/N, Xalapa, Veracruz, Mexico 91000.
Y. Khan
Department of Mathematics, Zhejiang University, Hangzhou 310027, China.
A. L. Herrera-May
Micro and Nanotechnology Research Center, University of Veracruz, Boca del Rio, Veracruz, Mexico 94292.
R. Castaneda-Sheissa
Electronic Instrumentation School and Atmospheric Sciences School, Universidad Veracruzana, Gonzalo Aguirre Beltrán S/N, Xalapa, Veracruz, Mexico 91000.
V. M. Jimenez-Fernandez
Electronic Instrumentation School and Atmospheric Sciences School, Universidad Veracruzana, Gonzalo Aguirre Beltrán S/N, Xalapa, Veracruz, Mexico 91000.
M. Vargas-Dorame
Electronic Instrumentation School and Atmospheric Sciences School, Universidad Veracruzana, Gonzalo Aguirre Beltrán S/N, Xalapa, Veracruz, Mexico 91000.
J. Sanchez-Orea
Electronic Instrumentation School and Atmospheric Sciences School, Universidad Veracruzana, Gonzalo Aguirre Beltrán S/N, Xalapa, Veracruz, Mexico 91000.
*Author to whom correspondence should be addressed.
Abstract
The increase of complexity on integrated circuits has also raised the demand for new testing methodologies capable to detect functional failures within circuits before they reach the market. Hence, this work proposes to explore the use of homotopy as a tool for testing a basic analog circuit. The homotopy path is influenced by nonlinearities from the equilibrium equation of the circuit; this situation can be used to infer faults by detecting changes on the homotopy path. The concept was explored using numerical simulation of a simple test circuit; then comparing results for the circuit with and without faults, obtaining modifications on the homotopy path like: the final point, number of iterations, and the number of turning points.
Keywords: Homotopy continuation, circuit testing, analog circuits